Scattering parameters of SMA coaxial connector pairs

A technique is described for making reflection and insertion loss measurements on microwave connectors, without the need for reference to calibrated or precision standards. The effects of connectors used in the measuring system are removed from the results, thus providing a means for testing and selecting cables from a group for specific critical applications. Results are given for a group of eight sections of Type 141 solid dielectric line having SMA connectors, and generic behavior is predicted for the SMA connector.