DocumentCode :
129385
Title :
Automatic detection of concurrency bugs through event ordering constraints
Author :
Murillo, Luis Gabriel ; Wawroschek, Simon ; Castrillon, Jeronimo ; Leupers, Rainer ; Ascheid, Gerd
Author_Institution :
Inst. for Commun. Technol. & Embedded Syst. (ICE), RWTH Aachen Univ., Aachen, Germany
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Writing correct parallel software for modern multiprocessor systems-on-chip (MPSoCs) is a complicated task. Programmers can rarely anticipate all possible external and internal interactions in complex concurrent systems. Concurrency bugs originating from races and improper synchronization are difficult to understand and reproduce. Furthermore, traditional debug and verification practices for embedded systems lack support to address this issue efficiently. For instance, programmers still need to step through several executions until finding a buggy state or analyze complex traces, which results in productivity losses. This paper proposes a new debug approach for MPSoCs that combines dynamic analysis and the benefits of virtual platforms. All in all, it (i) enables automatic exploration of SW behavior, (ii) identifies problematic concurrent interactions, (iii) provokes possibly erroneous executions and, ultimately, (iv) detects concurrency bugs. The approach is demonstrated on an industrial-strength virtual platform with a full Linux operating system and real-world parallel benchmarks.
Keywords :
Linux; concurrency control; embedded systems; parallel processing; program diagnostics; Linux operating system; MPSoC; automatic SW behavior exploration; automatic concurrency bug detection; complex concurrent systems; dynamic analysis; embedded systems; erroneous executions; event ordering constraints; industrial-strength virtual platform; multiprocessor system-on-chip; parallel software; problematic concurrent interaction identification; Computer bugs; Concurrent computing; Context; Monitoring; Semantics; Synchronization; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.295
Filename :
6800496
Link To Document :
بازگشت