DocumentCode :
1293876
Title :
Comparison of electromagnetic absorber used in anechoic and semi-anechoic chambers for emissions and immunity testing of digital devices
Author :
Holloway, Christopher L. ; DeLyser, Ronald R. ; German, Robert F. ; McKenna, Paul ; Kanda, Motohisa
Author_Institution :
Inst. for Telecommun. Sci., US Dept. of Commerce, Boulder, CO, USA
Volume :
39
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
33
Lastpage :
47
Abstract :
The absorber used in anechoic and semi-anechoic chambers employed for emissions and immunity testing of digital devices is examined. Using reflectivities obtained by the method of homogenization, the advantages and disadvantages of urethane pyramids, twisted-pyramids, wedges, as well as ferrite tiles, ferrite grids, and “hybrid” combinations of urethanes and ferrites, are determined. General reflectivity guidelines are also presented for comparing absorber used for the electromagnetic compatibility (EMC) testing of digital devices from 30 to 1000 MHz
Keywords :
UHF circuits; UHF measurement; VHF circuits; anechoic chambers; circuit testing; digital circuits; electromagnetic compatibility; electromagnetic wave absorption; electromagnetic wave reflection; ferrites; radiofrequency interference; 30 to 1000 MHz; EMC testing; UHF; VHF; anechoic chambers; digital devices; electromagnetic absorber; electromagnetic compatibility; emissions testing; ferrite grids; ferrite tiles; immunity testing; method of homogenization; reflectivities; semianechoic chambers; twisted pyramids; urethane pyramids; wedges; Anechoic chambers; Electromagnetic compatibility; Ferrites; Hair; Immunity testing; Manufacturing; Microwave frequencies; Optical reflection; Reflectivity; US Department of Commerce;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.554693
Filename :
554693
Link To Document :
بازگشت