Comparison of electromagnetic absorber used in anechoic and semi-anechoic chambers for emissions and immunity testing of digital devices

Author

Holloway, Christopher L. ; DeLyser, Ronald R. ; German, Robert F. ; McKenna, Paul ; Kanda, Motohisa

Author_Institution

Inst. for Telecommun. Sci., US Dept. of Commerce, Boulder, CO, USA

Volume

39

Issue

1

fYear

1997

fDate

2/1/1997 12:00:00 AM

Firstpage

33

Lastpage

47

Abstract

The absorber used in anechoic and semi-anechoic chambers employed for emissions and immunity testing of digital devices is examined. Using reflectivities obtained by the method of homogenization, the advantages and disadvantages of urethane pyramids, twisted-pyramids, wedges, as well as ferrite tiles, ferrite grids, and “hybrid” combinations of urethanes and ferrites, are determined. General reflectivity guidelines are also presented for comparing absorber used for the electromagnetic compatibility (EMC) testing of digital devices from 30 to 1000 MHz

Keywords

UHF circuits; UHF measurement; VHF circuits; anechoic chambers; circuit testing; digital circuits; electromagnetic compatibility; electromagnetic wave absorption; electromagnetic wave reflection; ferrites; radiofrequency interference; 30 to 1000 MHz; EMC testing; UHF; VHF; anechoic chambers; digital devices; electromagnetic absorber; electromagnetic compatibility; emissions testing; ferrite grids; ferrite tiles; immunity testing; method of homogenization; reflectivities; semianechoic chambers; twisted pyramids; urethane pyramids; wedges; Anechoic chambers; Electromagnetic compatibility; Ferrites; Hair; Immunity testing; Manufacturing; Microwave frequencies; Optical reflection; Reflectivity; US Department of Commerce;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.554693

Filename

554693