• DocumentCode
    1293927
  • Title

    Tunnel Diode Modeling, Including Nonlocal Trap-Assisted Tunneling: A Focus on III–V Multijunction Solar Cell Simulation

  • Author

    Baudrit, Mathieu ; Algora, Carlos

  • Author_Institution
    Inst. de Energia Solar, Univ. Politec. de Madrid, Madrid, Spain
  • Volume
    57
  • Issue
    10
  • fYear
    2010
  • Firstpage
    2564
  • Lastpage
    2571
  • Abstract
    Multijunction solar cells (MJCs) based on III-V semiconductors constitute the state-of-the-art approach for high-efficiency solar energy conversion. These devices, consisting of a stack of various solar cells, are interconnected by tunnel diodes. Reliable simulations of the tunnel diode behavior are still a challenge for solar cell applications. In this paper, a complete description of the model implemented in Silvaco ATLAS is shown, demonstrating the importance of local and nonlocal trap-assisted tunneling. We also explain how the measured doping profile and the metalization-induced series resistance influence the behavior of the tunnel diodes. Finally, we detail the different components of the series resistance and show that this can help extract the experimental voltage drop experienced by an MJC due to the tunnel junction. The value of this intrinsic voltage is important for achieving high efficiencies at concentrations near 1000 suns.
  • Keywords
    III-V semiconductors; semiconductor device models; solar cells; solar energy conversion; tunnel diodes; tunnelling; III-V multijunction solar cell simulation; III-V semiconductors; Silvaco ATLAS; doping profile; high-efficiency solar energy conversion; local trap-assisted tunneling; metalization-induced series resistance; nonlocal trap-assisted tunneling; series resistance; tunnel diode modeling; Absorption; Electron traps; Energy barrier; Junctions; MOSFETs; Photovoltaic cells; Quantum mechanics; Resistance; Semiconductor diodes; Semiconductor process modeling; Solar energy; Sun; Tunneling; Voltage; III–V semiconductors; simulation; solar cell; tunnel diode;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2061771
  • Filename
    5546937