DocumentCode :
1293927
Title :
Tunnel Diode Modeling, Including Nonlocal Trap-Assisted Tunneling: A Focus on III–V Multijunction Solar Cell Simulation
Author :
Baudrit, Mathieu ; Algora, Carlos
Author_Institution :
Inst. de Energia Solar, Univ. Politec. de Madrid, Madrid, Spain
Volume :
57
Issue :
10
fYear :
2010
Firstpage :
2564
Lastpage :
2571
Abstract :
Multijunction solar cells (MJCs) based on III-V semiconductors constitute the state-of-the-art approach for high-efficiency solar energy conversion. These devices, consisting of a stack of various solar cells, are interconnected by tunnel diodes. Reliable simulations of the tunnel diode behavior are still a challenge for solar cell applications. In this paper, a complete description of the model implemented in Silvaco ATLAS is shown, demonstrating the importance of local and nonlocal trap-assisted tunneling. We also explain how the measured doping profile and the metalization-induced series resistance influence the behavior of the tunnel diodes. Finally, we detail the different components of the series resistance and show that this can help extract the experimental voltage drop experienced by an MJC due to the tunnel junction. The value of this intrinsic voltage is important for achieving high efficiencies at concentrations near 1000 suns.
Keywords :
III-V semiconductors; semiconductor device models; solar cells; solar energy conversion; tunnel diodes; tunnelling; III-V multijunction solar cell simulation; III-V semiconductors; Silvaco ATLAS; doping profile; high-efficiency solar energy conversion; local trap-assisted tunneling; metalization-induced series resistance; nonlocal trap-assisted tunneling; series resistance; tunnel diode modeling; Absorption; Electron traps; Energy barrier; Junctions; MOSFETs; Photovoltaic cells; Quantum mechanics; Resistance; Semiconductor diodes; Semiconductor process modeling; Solar energy; Sun; Tunneling; Voltage; III–V semiconductors; simulation; solar cell; tunnel diode;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2061771
Filename :
5546937
Link To Document :
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