Title :
Dose rate dependence of the current noise performance of an ultra-low noise precision bipolar operational amplifier
Author :
Hiemstra, David M.
Author_Institution :
Space & Adv. Robotics Ltd., Macdonald Dettwiler, Brampton, Ont., Canada
Abstract :
The dose rate dependence of the current noise of a bipolar operational amplifier is presented. Total current noise performance degrades linearly with increasing dose rate. Generation-recombination, white and 1/f spectral components contribute to the degradation. The generation-recombination component is the most significant contributor to dose rate dependent current noise degradation.
Keywords :
1/f noise; bipolar integrated circuits; electron-hole recombination; integrated circuit noise; integrated circuit testing; operational amplifiers; radiation hardening (electronics); white noise; 1/f spectral noise; current noise performance; dose rate dependence; dose rate dependent current noise degradation; generation-recombination noise; ultra-low noise precision bipolar operational amplifier; white noise; Circuit noise; Circuit testing; Degradation; Frequency; Gain measurement; Inspection; Manufacturing; Noise generators; Operational amplifiers; Orbital robotics;
Journal_Title :
Nuclear Science, IEEE Transactions on
