DocumentCode :
1294130
Title :
Time-domain low frequency approximation for the off-diagonal terms of the ground impedance matrix
Author :
Orzan, David
Author_Institution :
Lab. de Reseaux d´´Energie Electrique, Ecole Polytech. Federale de Lausanne, Switzerland
Volume :
39
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
64
Abstract :
The ground impedance is one of the parameters needed for field-to-transmission line coupling calculations. In the case of multiconductor lines this ground impedance is a full matrix with diagonal (self-impedance) and off-diagonal (mutual impedance) terms, The expression for the mutual ground impedance between two conductors i and j has been derived by Sunde (1968) and a low frequency approximation by Carson (1926). The general expression for the ground impedance matrix terms in the frequency-domain does nor have an analytical inverse Fourier transform. Therefore, the elements of the “transient ground resistance” matrix in time-domain should be, in general, determined using an inverse Fourier transform algorithm. In low-frequency approximation, however, Timotin (1967) and Mok and Costache (1992) has found an analytical inverse Fourier transform for the ground self-impedance. We extend the Timotin formula to the off-diagonal terms of the ground resistance matrix
Keywords :
Fourier transforms; electric impedance; electromagnetic field theory; inverse problems; time-frequency analysis; transmission line matrix methods; Timotin formula; field-to-transmission line coupling calculations; ground impedance matrix; inverse Fourier transform; inverse Fourier transform algorithm; multiconductor lines; mutual ground impedance; off-diagonal terms; time-domain low frequency approximation; transient ground resistance; Conductivity; Conductors; Convolution; Fourier transforms; Frequency domain analysis; Genetic expression; Impedance; Integral equations; Matrix decomposition; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.554697
Filename :
554697
Link To Document :
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