DocumentCode :
129425
Title :
Spintronics for low-power computing
Author :
Yue Zhang ; Weisheng Zhao ; Klein, Jacques-Olivier ; Wang Kang ; Querlioz, Damien ; Youguang Zhang ; Ravelosona, Dafine ; Chappert, Claude
Author_Institution :
IEF, Univ. Paris-Sud, Orsay, France
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Microelectronics has been following Moore´s law for almost 40 years. However this trend tends to run out of steam in recent technology nodes. The continuous improvements in the size of the transistors and in the operating frequencies result in serious power consumption, heat dissipation and reliability issues. Spintronics (Nobel Prize of Physics, 2007 awarded to Prof. Fert from Univ. Paris-Sud and Peter Grünberg from Forschungszentrum Jülich) nanodevices can reduce significantly the power, improve the reliability or allow new functionalities. The 2010 ITRS report on emerging research devices identified Magnetic Tunnel Junction (MTJ) nanopillar (the preeminent spintronics nanodevice) as one of the most promising technologies to be part of the future microelectronics circuits. It provides data non-volatility, hardness to radiations, fast data access and low-power operations. Magnetic memories become the most promising candidate for both low power logic computing and the data storage. This tutorial paper presents multi-discipline questions (Device, Circuit, Architecture, System and CAD) related to this topic to share the most recent results and discuss the future challenges.
Keywords :
integrated circuit reliability; low-power electronics; magnetic storage; magnetic tunnelling; magnetoelectronics; nanoelectronics; radiation hardening (electronics); CAD; ITRS report; MTJ; Moore law; data nonvolatility; heat dissipation; low-power computing; magnetic memories; magnetic tunnel junction; microelectronics circuits; nanodevices; nanopillar; power consumption; radiation hardness; reliability; spintronics; CMOS integrated circuits; Logic gates; Magnetic domain walls; Magnetic resonance imaging; Magnetic tunneling; Magnetoelectronics; Memristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.316
Filename :
6800517
Link To Document :
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