DocumentCode :
129432
Title :
Brisk and limited-impact NoC routing reconfiguration
Author :
Doowon Lee ; Parikh, Ritesh ; Bertacco, Valeria
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
The expected low reliability of the silicon substrate at upcoming technology nodes presents a key challenge for digital system designers. Networks-on-chip (NoCs) are especially concerning because they are often the only communication infrastructure for the chips in which they are deployed. Recently, routing reconfiguration solutions have been proposed to address this problem. However, they come at a high silicon cost, and often require suspending the normal network activity while executing a centralized, resource-hungry reconfiguration algorithm. This paper proposes a novel, fast and minimalistic routing reconfiguration algorithm, called BLINC. BLINC utilizes pre-computed routing metadata to quickly evaluate localized detours upon each fault manifestation. We showcase the efficacy of our algorithm by deploying it in a novel NoC fault detection and reconfiguration solution, where BLINC enables uninterrupted NoC operation during aggressive online testing. If a fault seems likely to occur, we circumvent it in advance with the aid of our BLINC reconfiguration algorithm. Experimental results show an 80% reduction in the average number of routers affected by a reconfiguration event, compared to state-of-the-art techniques. BLINC enables negligible performance degradation in our detection and reconfiguration solution, while solutions based on current techniques suffer a 17-fold latency increase.
Keywords :
fault diagnosis; integrated circuit testing; network routing; network-on-chip; 17-fold latency; BLINC; Si; aggressive online testing; brisk NoC; communication infrastructure; digital system designers; fault detection; limited-impact NoC; minimalistic routing reconfiguration; network-on-chip; pre-computed routing metadata; resource-hungry reconfiguration; silicon substrate; uninterrupted NoC operation; Network topology; Ports (Computers); Routing; Silicon; System recovery; Testing; Topology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.319
Filename :
6800520
Link To Document :
بازگشت