DocumentCode :
1294331
Title :
Application of avalanche transistors to circuits with a long mean time to failure
Author :
Herden, Werner B.
Author_Institution :
Inst. fur Phys. Elektronik, Univ. Stuttgart, Stuttgart, West Germany
Issue :
2
fYear :
1976
fDate :
6/1/1976 12:00:00 AM
Firstpage :
152
Lastpage :
160
Abstract :
This paper intends to give circuit designers a survey of the performance limits of transistors in the avalanche region and show their practical use in reliable long-lived devices. The most important problems encountered when designing special circuits are discussed in detail. In particular, the conditions for obtaining reflection-free rectangular pulses are presented. Furthermore, criteria for choosing the proper transistor types are given, and some rather suitable types are specified. Finally, different methods of parallel and series operation for large current and voltage pulses, respectively, are discussed and demonstrated.
Keywords :
bipolar transistors; pulse generators; reliability; avalanche transistors; long mean time to failure; performance limits; pulse generator; Delay; Electric breakdown; Integrated circuit reliability; Resistance; Switching circuits; Transistors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1976.6312331
Filename :
6312331
Link To Document :
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