DocumentCode
1294331
Title
Application of avalanche transistors to circuits with a long mean time to failure
Author
Herden, Werner B.
Author_Institution
Inst. fur Phys. Elektronik, Univ. Stuttgart, Stuttgart, West Germany
Issue
2
fYear
1976
fDate
6/1/1976 12:00:00 AM
Firstpage
152
Lastpage
160
Abstract
This paper intends to give circuit designers a survey of the performance limits of transistors in the avalanche region and show their practical use in reliable long-lived devices. The most important problems encountered when designing special circuits are discussed in detail. In particular, the conditions for obtaining reflection-free rectangular pulses are presented. Furthermore, criteria for choosing the proper transistor types are given, and some rather suitable types are specified. Finally, different methods of parallel and series operation for large current and voltage pulses, respectively, are discussed and demonstrated.
Keywords
bipolar transistors; pulse generators; reliability; avalanche transistors; long mean time to failure; performance limits; pulse generator; Delay; Electric breakdown; Integrated circuit reliability; Resistance; Switching circuits; Transistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1976.6312331
Filename
6312331
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