• DocumentCode
    1294331
  • Title

    Application of avalanche transistors to circuits with a long mean time to failure

  • Author

    Herden, Werner B.

  • Author_Institution
    Inst. fur Phys. Elektronik, Univ. Stuttgart, Stuttgart, West Germany
  • Issue
    2
  • fYear
    1976
  • fDate
    6/1/1976 12:00:00 AM
  • Firstpage
    152
  • Lastpage
    160
  • Abstract
    This paper intends to give circuit designers a survey of the performance limits of transistors in the avalanche region and show their practical use in reliable long-lived devices. The most important problems encountered when designing special circuits are discussed in detail. In particular, the conditions for obtaining reflection-free rectangular pulses are presented. Furthermore, criteria for choosing the proper transistor types are given, and some rather suitable types are specified. Finally, different methods of parallel and series operation for large current and voltage pulses, respectively, are discussed and demonstrated.
  • Keywords
    bipolar transistors; pulse generators; reliability; avalanche transistors; long mean time to failure; performance limits; pulse generator; Delay; Electric breakdown; Integrated circuit reliability; Resistance; Switching circuits; Transistors;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1976.6312331
  • Filename
    6312331