• DocumentCode
    1294451
  • Title

    Simulations of the performance of the MVD in PHENIX

  • Author

    Bennett, M.J. ; Bernardin, J. ; Boissevain, J. ; Britton, C. ; Chang, J. ; Clark, D. ; Conway, R. ; Cunningham, R. ; Emery, M. ; Ericson, N. ; Fung, S.-Y. ; Hahn, S. ; Van Hecke, H. ; Jaffe, D. ; Kang, J.-H. ; Kim, S.-Y. ; Kim, Y.-G. ; Lind, R. ; Marek, L

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    46
  • Issue
    6
  • fYear
    1999
  • Firstpage
    2022
  • Lastpage
    2026
  • Abstract
    The PHENIX Multiplicity Vertex Detector (MVD) provides event characterization, a centrality trigger, collision vertex position, and measures fluctuations in charged particle multiplicities. The design criteria include a large rapidity coverage, good azimuthal coverage and granularity, minimizing material in the electron arm acceptance, and minimizing costs. The MVD contains two concentric barrels of Si strip detectors with two disk-shaped Si pad detector endcaps. Simulations show that the vertex position can be located to within a few hundred microns using hits in the barrels. A channel multiplicity signal is formed for use in the Level-1 trigger. The effect of the expected discriminator performance on this trigger signal will be shown. The pad and strip detectors are read-out with identical electronics. The influence of the performance of the electronics on the detector´s performance are discussed.
  • Keywords
    nuclear electronics; position sensitive particle detectors; silicon radiation detectors; PHENIX Multiplicity Vertex Detector; Si; Si strip detectors; centrality trigger; channel multiplicity signal; charged particle multiplicities; collision vertex position; disk-shaped Si pad detector endcaps; electron arm acceptance; event characterization; Arm; Azimuthal angle; Costs; Current measurement; Detectors; Electrons; Particle measurements; Position measurement; Silicon; Strips;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.819275
  • Filename
    819275