DocumentCode
129457
Title
ArChiVED: Architectural checking via event digests for high performance validation
Author
Chang-Hong Hsu ; Chatterjee, Debangshu ; Morad, R. ; Ga, Raviv ; Bertacco, Valeria
Author_Institution
Univ. of Michigan, Ann Arbor, MI, USA
fYear
2014
fDate
24-28 March 2014
Firstpage
1
Lastpage
6
Abstract
Simulation-based techniques play a key role in validating the functional correctness of microprocessor designs. A common approach for validating microprocessors (called instruction-by-instruction, or IBI checking) consists of running a RTL and an architectural simulation in lock-step, while comparing processor architectural state at each instruction retirement. This solution, however, cannot be deployed on long regression tests, because of the limited performance of RTL simulators. Acceleration platforms have the performance power to overcome this issue, but are not amenable to the deployment of an IBI checking methodology. Indeed, validation on these platforms requires logging activity on-platform and then checking it against a golden model off-platform. Unfortunately, an IBI checking approach following this paradigm entails a large slowdown for the acceleration platform, because of the sizable amount of data that must be transferred off-platform for comparison against the golden model. In this work we propose a sequence-by-sequence (SBS) checking approach that is efficient and practical for acceleration platforms. Our solution validates the test execution over sequences of instructions (instead of individual ones), thus greatly reducing the amount of data transferred for off-platform checking. We found that SBS checking delivers the same bug-detection accuracy as traditional IBI checking, while reducing the amount of traced data by more than 90%.
Keywords
logic design; microprocessor chips; ArChiVED; IBI checking methodology; RTL simulators; SBS checking approach; acceleration platform; architectural checking via event digests; bug-detection accuracy; golden model off-platform; high performance validation; instruction-by-instruction checking; microprocessor designs; off-platform checking; processor architectural state; sequence-by-sequence checking approach; simulation-based techniques; Acceleration; Accuracy; Computer bugs; Integrated circuit modeling; Registers; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location
Dresden
Type
conf
DOI
10.7873/DATE.2014.330
Filename
6800531
Link To Document