Characterization of a Langevin transducer incorporating Mn-doped piezocrystal material

Recent developments of third generation relaxor-PT piezoelectric type single crystals, Mn:PIN-PMN-PT, herald significant potential benefits to high power ultrasonic devices due to their high electro-mechanical coupling coefficient, low mechanical losses and increased temperature and electric field stability. This study reports on two power ultrasonic transducers, one based on piezocrystal and one based on piezoceramic. The transducers are characterized experimentally to identify their resonant behavior under different conditions and their properties are investigated over an extended period to analyse transducer stability.