DocumentCode :
1294814
Title :
Transistor noise measurements
Author :
Stephenson, W.L.
Volume :
1
Issue :
11
fYear :
1955
fDate :
11/1/1955 12:00:00 AM
Firstpage :
700
Keywords :
noise measurement; transistors;
fLanguage :
English
Journal_Title :
Electrical Engineers, Journal of the Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jiee-3.1955.0266
Filename :
5321390
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1294814
