Title :
Measurement method for the large-signal admittance of mounted IMPATT diodes
Author :
Mansour, Nagi A. ; Goud, Paul A.
Author_Institution :
Dept. of Electrical Engng., Univ. of Alberta, Edmonton, Alta., Canada
fDate :
3/1/1981 12:00:00 AM
Abstract :
The procedure employs a network analyzer and a computer optimization routine. An error network is introduced to account for drift of the measurement system and a second network is used to account for the mounted-diode parasitics. The measurement method is rapid and accurate, and is especially suitable when measurements are required at several frequencies. Typical large-signal admittance results, obtained for a Si IMPATT diode at several frequencies, are presented.
Keywords :
IMPATT diodes; computerised instrumentation; electric admittance measurement; network analysers; IMPATT diodes; computer optimization routine; error network; impedance measurement; large-signal admittance; network analyzer; Admittance; Frequency measurement; Impedance; Measurement uncertainty; Radio frequency; Transmission line measurements; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1981.6312433
