• DocumentCode
    1295132
  • Title

    Microprocessor-controlled acquisition system for the determination of MOS transistor parameters

  • Author

    Lambot, Jean-Pierre ; Fontaine, Alain ; Jespers, Paul G A ; White, Marvin H.

  • Author_Institution
    Berkel SA, Brussels, Belgium
  • Issue
    2
  • fYear
    1981
  • fDate
    6/1/1981 12:00:00 AM
  • Firstpage
    124
  • Lastpage
    128
  • Abstract
    Discusses a microprocessor-controlled data acquisition system for automated acquisition of MOS transistor parameters. The Analog Signal Processor and the Control Interface Circuit are described. Finally, the authors explain the procedure of parameter determination based on the least squares estimation criterion. This procedure is applied to long-channel, surface-channel, enhancement-mode PMOS transistors. The ID-VD curves exhibit an accuracy of 1-3 percent compared with the experimental characteristics.
  • Keywords
    computerised instrumentation; data acquisition; insulated gate field effect transistors; Analog Signal Processor; Control Interface Circuit; MOS transistor parameters; computerised instrumentation; field effect transistors; least squares estimation; long-channel, surface-channel, enhancement-mode PMOS transistors; metal-insulator-semiconductor transistors; microprocessor-controlled data acquisition system; Current measurement; MOSFETs; Microprocessors; Mirrors; Threshold voltage; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1981.6312459
  • Filename
    6312459
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1295132