Title :
Substrate-related kink effects with a strong light-sensitivity in AlGaAs/InGaAs PHEMT
Author :
Haruyama, Junzi ; Negishi, Hitoshi ; Nishimura, Yoshikazu ; Nashimoto, Yasunobu
fDate :
1/1/1997 12:00:00 AM
Abstract :
The direct observation of substrate potential (Vsub) changes is experimentally reported, for the first time, on three kinds of kink effects (abrupt increases of drain current) with a strong light-sensitivity in an AlGaAs/InGaAs Pseudomorphic HEMT (PHEMT). The dependence of Vsub on the kink effects are measured by using a side-gate electrode. The first kink effect is observed with a Vsub increase from negative to positive value with light. In the dark, with this kink effect eliminated, the second and third kink effects are observed with Vsub changes at high and low VDs, respectively. In the second and third kinks, the Vsubs have positive values in all the VD region, while there exist two VD regions in which logarithmic values of Vsub remain constant (Vsub plateaus). Both V subs start to increase again near the kink VDs with different dependences on VG reduction by applying further VD. The mechanisms of the kink effects are discussed based on the behavior of Vsub and other experimental results, such as photo-sensitivity of the side-gating effect, observation of electron emission in transient waveform, irradiation with a monochromatic light source, and a current DLTS using a sidegate electrode. This work suggests that observation of Vsub is one of the useful ways to clarify the mechanism of the kink effect
Keywords :
III-V semiconductors; aluminium compounds; deep level transient spectroscopy; gallium arsenide; high electron mobility transistors; impact ionisation; indium compounds; photoconductivity; AlGaAs-InGaAs; PHEMT; current DLTS; drain current; electron emission; light sensitivity; monochromatic light source; side-gate electrode; substrate potential changes; substrate-related kink effects; transient waveform; Buffer layers; Electrodes; Electron emission; Gallium arsenide; Impact ionization; Indium gallium arsenide; MESFETs; MOSFETs; PHEMTs; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on