Title :
Protocol attacks on advanced PUF protocols and countermeasures
Author :
van Dijk, Marius ; Ruhrmair, U.
Author_Institution :
Univ. of Connecticut Storrs, Storrs, CT, USA
Abstract :
In recent years, PUF-based schemes have not only been suggested for the basic security tasks of tamper sensitive key storage or system identification, but also for more complex cryptographic protocols like oblivious transfer (OT), bit commitment (BC), or key exchange (KE). These more complex protocols are secure against adversaries in the stand-alone, good PUF model. In this survey, a shortened version of [17], we explain the stronger bad PUF model and PUF re-use model. We argue why these stronger attack models are realistic, and that existing protocols, if used in practice, will need to face these. One consequence is that the design of advanced cryptographic PUF protocols needs to be strongly reconsidered. It suggests that Strong PUFs require additional hardware properties in order to be broadly usable in such protocols: Firstly, they should ideally be erasable, meaning that single PUF-responses can be erased without affecting other responses. If the area efficient implementation of this feature turns out to be difficult, new forms of Controlled PUFs [3] (such as Logically Erasable and Logically Reconfigurable PUFs [6]) may suffice in certain applications. Secondly, PUFs should be certifiable, meaning that one can verify that the PUF has been produced faithfully and has not been manipulated in any way afterwards. The combined implementation of these features represents a pressing and challenging problem for the PUF hardware community.
Keywords :
cryptographic protocols; Logically Erasable PUF; Logically Reconfigurable PUF; bit commitment; cryptographic protocols; key exchange; key storage; oblivious transfer; physical unclonable functions protocols; protocol attacks; system identification; Communities; Computational modeling; Cryptography; Hardware; Nonvolatile memory; Protocols; (Strong) PUFs; (Strong) Physical Unclonable Functions; Attack Models; Bit Commitment; Certifiable PUFs; Erasable PUFs; Key Exchange; Oblivious Transfer;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.364