Title :
Optimisation of InGaAs infrared photovoltaic detectors
Author :
Piotrowski, J. ; Kaniewski, J.
Author_Institution :
Vigo Syst., Warsaw, Poland
fDate :
8/1/1999 12:00:00 AM
Abstract :
The ultimate signal-to-noise performance of infrared photodetectors is limited by the statistical nature of the thermal generation and recombination of charge carriers. Band-to-band Auger processes dominate in a high quality InGaAs used for photovoltaic detector operating at room temperature. The performance of devices operating in the 2-3.4 μm spectral range has been analyzed theoretically. Homo- and heterostructure devices have been considered. The use of n+np+ (or n+pp+) with heavily doped regions has been found to prevent the recombination of photogenerated carriers at contacts, but the bulk thermal generation in the heavily doped regions will significantly reduce the performance of the devices
Keywords :
Auger effect; III-V semiconductors; gallium arsenide; indium compounds; infrared detectors; photovoltaic effects; semiconductor doping; statistical analysis; 2 to 3.4 mum; InGaAs; InGaAs infrared photovoltaic detector optimisation; band-to-band Auger processes; bulk thermal generation; charge carrier recombination; heavily doped regions; heterostructure devices; high quality InGaAs; homostructure devices; infrared photodetectors; photogenerated carriers; photovoltaic detector; room temperature; statistical nature; thermal generation; ultimate signal-to-noise performance;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:19990658