DocumentCode :
1295259
Title :
Microwave interferometer for measurements of small displacements
Author :
Thansandote, A. ; Stuchly, S.S. ; Wight, Jim S.
Author_Institution :
Dept. of Electrical Engng., Univ. of Ottawa, Ottawa, Ont., Canada
Issue :
4
fYear :
1982
Firstpage :
227
Lastpage :
232
Abstract :
Two microwave interferometer systems developed for noncontact measurements of small displacements in an electromagnetically semitransparent medium are described. Arrangements for testing the instruments and experimental results are presented. The principal characteristics of the systems, e.g. the output signal versus the displacement of the scattering object, are linear for the two-way losses in the medium between the antenna and the object below 60 dB. The maximum displacement of the object is limited to a half-wavelength in the test medium by the interference between the signal backscattered by the test object and the signal reflected from the antenna.
Keywords :
displacement measurement; electromagnetic wave interferometers; microwave measurement; electromagnetically semitransparent medium; microwave interferometer systems; noncontact measurements of small displacements; Antenna measurements; Attenuation; Displacement measurement; Microwave antennas; Microwave measurements; Reflector antennas;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1982.6312480
Filename :
6312480
Link To Document :
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