Sub-Poisson statistics observed in an electronically shuttered and back-illuminated CCD pixel

Author

Reich, Robert K.

Author_Institution

Lincoln Lab., MIT, Lexington, MA, USA

Volume

44

Issue

1

fYear

1997

fDate

1/1/1997 12:00:00 AM

Firstpage

69

Lastpage

73

Abstract

The variance versus average signal has been measured for a pixel in an electronically shuttered and back-illuminated CCD imaging array. The measurements demonstrate that, over a certain operating range, the electronic shutter modifies the input Poisson distributed photoelectrons during the collection process such that the charge signal accumulated in the CCD well has a sub-Poisson distribution (variance less than the mean). A simple one-dimensional model has been developed that explains the experimental results

Keywords

CCD image sensors; Poisson distribution; semiconductor device models; semiconductor device noise; CCD imaging array; back-illuminated CCD pixel; charge signal; collection process; electronically shuttered CCD; input Poisson distributed photoelectrons; one-dimensional model; operating range; sub-Poisson distribution; sub-Poisson statistics; Charge coupled devices; Charge measurement; Current measurement; Doping profiles; Electrodes; Noise reduction; Pixel; Potential well; Signal generators; Statistics;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.554794

Filename

554794