DocumentCode
1295311
Title
Temperature Effect on
-Band Current-Reused Common-Gate LNA in 0.13-
CMOS T
Author
Chen, Wen-Lin ; Chang, Sheng-Fuh ; Chen, Kun-Ming ; Huang, Guo-Wei ; Chang, Jen-Chung
Author_Institution
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
Volume
57
Issue
9
fYear
2009
Firstpage
2131
Lastpage
2138
Abstract
This paper presents the temperature effect on a Ku-band NMOS common-gate low-noise amplifier (CG-LNA). The temperature characteristics of an NMOS transistor and spiral inductors are obtained over the temperature range from 253 to 393 K. These results show that the optimal bias condition minimizes the transconductance and drain current temperature variations. Based on these results, a current-reused CG-LNA with good temperature performance is designed. At ambient temperatures, the CG-LNA has a measured power gain of 10.3 dB and a noise figure (NF) of 4.3 dB at 15.2 GHz, while consuming 4.5 mA from a 1.3-V power supply. When the temperature varies from 253 to 393 K, the CG-LNA has a power gain variation of 3 dB, NF variation of 2 dB , and dc power consumption variation of 11.9%. This paper is the first to report the temperature effect on Ku-band CG-LNAs.
Keywords
CMOS analogue integrated circuits; MOSFET; field effect MMIC; inductors; low noise amplifiers; microwave amplifiers; CMOS technology; Ku-band NMOS common-gate low-noise amplifier; NMOS transistor; current 4.5 mA; current-reused CG-LNA; drain current; frequency 15.2 GHz; gain 10.3 dB; noise figure 4.3 dB; power consumption; spiral inductors; temperature 253 K to 393 K; transconductance; voltage 1.3 V; CMOS; common gate; current reuse; low-noise amplifier (LNA); zero temperature coefficient;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2009.2027074
Filename
5200390
Link To Document