Title :
A dynamic test method for high-resolution A/D converters
Author :
Souders, T. Michael
Author_Institution :
Electrosystems Division, National Bureau of Standards, Washington, DC 20234
fDate :
3/1/1982 12:00:00 AM
Abstract :
A dynamic test method is described for A/D converters having up to 16 bits of resolution. The technique exercises the test converter with stepped input changes, simulating the output of an S/H amplifier. Dynamic errors as low as 4 ppm can be measured within 4 ßs following a step change as large as 20 V.
Keywords :
Feedback loop; Resistance; Resistors; Switches; Switching circuits; Time measurement; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1982.6312502
