Editorial

IEEE-NEMS 2011 is an annual conference focusing on MEMS and nanotechnology, and this year it was held on February 20??23 in Kaohsiung, Taiwan. The conference brings together leading scholars and researchers worldwide to disseminate their latest and advanced findings in micro??nano fields. This year we received 439 abstracts from more than 20 countries and a total of 313 papers (including late-news papers) were judiciously selected by the 60-member Technical Program Committee (TPC). This special issue of the IET??s Micro & Nano Letters was advertised prior to the conference on the website and during the conference through handouts. After the conference, we received 63 submissions to the special issue of expanded manuscripts (including revisions) from the conference attendees. Only the top 30% of scored abstracts were recommended to submit an expanded manuscript, and these then needed to demonstrate significant new results over the full paper in the conference proceedings. Following the standard peer review process, 26 expanded manuscripts were accepted for publication in this special issue.