• DocumentCode
    1295559
  • Title

    Thermal switch design by using complementary metal??oxide semiconductor MEMS fabrication process

  • Author

    Jin-Chern Chiou ; Lei-Chun Chou ; You-Liang Lai ; Ying-Zong Juang ; Sheng-Chieh Huang

  • Author_Institution
    Dept. of Electr. Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    6
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    534
  • Lastpage
    536
  • Abstract
    The present study focuses on implementing a complementary metal-oxide semiconductor (CMOS) microelectromechanical system thermal switch by using the commercially available Taiwan Semiconductor Manufacturing Company (TSMC) 0.35 μm two-poly four-metal CMOS process. There are two novel designs: first, the soft contact structure and post-processing fabrication; second, a new design of thermal actuator. To create the soft contact structure, residual stress effect has been utilised to make different bending curvatures. According to the experiments, the layer metal-1 has the largest residual stress effect that can achieve the largest deflection in the z-axis. Because the residual stress of the layer metal-1 is negative, the structure will bend down after release, hence providing larger contact area, which has been set up to obtain the lowest contact miss ability. In the post-processing fabrication, 0.3 μm thickness gold will be patterned at the contact tips. Since gold, rather than aluminium, has no oxidation issue, it has more reliability in preventing the problem of oxidation than aluminium. In the new thermal actuator design, the authors designed a novel folded-flexure with the electrothermal excitation to turn the switch on or off. In the prototype, the device size is 500 × 400 μm and the gap between two contact pads is 9 μm in off-state. Depending on the simulation results, the switch can work stably at 3 V, and the working temperature and operating bandwidth are individually 20-200°C.
  • Keywords
    CMOS integrated circuits; actuators; gold; internal stresses; microswitches; reliability; Au; MEMS fabrication process; Taiwan Semiconductor Manufacturing Company; complementary metal-oxide semiconductor process; contact tips; electrothermal excitation; folded-flexure; gold; post-processing fabrication; reliability; residual stress; size 0.35 mum; soft contact structure; temperature 20 degC to 200 degC; thermal actuator; thermal switch; two-poly four-metal CMOS process; voltage 2 V;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0122
  • Filename
    5981660