Phase Locked BWO System for Open Resonator Measurement in D-Band

Author

Gao, Yuanci ; Jones, C.R. ; Dutta, J.M.

Author_Institution

Phys. Dept., North Carolina Central Univ., Durham, NC, USA

Volume

19

Issue

9

fYear

2009

Firstpage

599

Lastpage

601

Abstract

The combination of a D-Band phase-locked backward-wave oscillator (BWO) with a spectrum analyzer for measurement of permittivity and low loss-tangent is presented. For measuring low loss tangent material, such as CVD diamond and high purity semi-insulating (HPSI) 4H-SiC , at millimeter wave ranges, it is necessary to precisely measure an increase of a few kHz in a line-width of 200 kHz. We describe a phase-locked loop with frequency conversion that combines a BWO source and a microwave spectrum analyzer to obtain line-width measurements with less than 2 kHz (less than 1%) standard deviation in D-Band millimeter wave.

Keywords

backward wave oscillators; diamond; dielectric losses; elemental semiconductors; microwave measurement; millimetre wave frequency convertors; millimetre wave oscillators; permittivity; permittivity measurement; phase locked loops; silicon compounds; spectral analysers; wide band gap semiconductors; BWO; C; CVD diamond; D-Band millimeter wave; SiC; backward-wave oscillator; frequency conversion; line-width measurements; loss-tangent; microwave spectrum analyzer; open resonator measurement; permittivity; phase-locked loop; Backward-wave oscillators (BWOs); frequency conversion; millimeter wave; phase-locked loop (PLL);

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2009.2027098

Filename

5200452