DocumentCode
1295745
Title
Noise analysis of frequency converters utilizing semiconductor-laser amplifiers
Author
Obermann, Kristof ; Koltchanov, Igor ; Petermann, Klaus ; Diez, Stefan ; Ludwig, Reinhold ; Weber, Hans G.
Author_Institution
Fachgebiet Hochfrequenztech., Tech. Univ. Berlin, Germany
Volume
33
Issue
1
fYear
1997
fDate
1/1/1997 12:00:00 AM
Firstpage
81
Lastpage
88
Abstract
This paper deals with a general problem concerning semiconductor-laser amplifiers used for frequency conversion. The amplified spontaneous emission (ASE) of a saturated amplifier is investigated experimentally and theoretically. An analytical solution accounting for the spatial dependence of the inversion parameter as well as the spectral dependence of the ASE is derived. Hence, the results can be applied to arbitrary saturation conditions and frequency shifts. Our theory is applied to frequency converters based on four-wave mixing and is found to be in good agreement with both the numerical results and the experimental data. In order to quantify the performance of a frequency converter, a noise figure is defined and shown to be strongly dependent on the frequency detuning and the power of the input waves
Keywords
laser noise; laser theory; laser tuning; multiwave mixing; optical frequency conversion; optical saturable absorption; optical transmitters; semiconductor device models; semiconductor device noise; semiconductor lasers; amplified spontaneous emission; arbitrary saturation conditions; four-wave mixing; frequency conversion; frequency converters; frequency detuning; frequency shifts; inversion parameter; noise analysis; noise figure; saturated amplifier; semiconductor-laser amplifiers; spatial dependence; spectral dependence; Four-wave mixing; Frequency conversion; Optical amplifiers; Optical frequency conversion; Optical noise; Optical saturation; Semiconductor device noise; Semiconductor optical amplifiers; Spontaneous emission; Stimulated emission;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.554895
Filename
554895
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