• DocumentCode
    1295781
  • Title

    Power Flow Characterization of a Bidirectional Galvanically Isolated High-Power DC/DC Converter Over a Wide Operating Range

  • Author

    Xie, Yanhui ; Sun, Jing ; Freudenberg, James S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    25
  • Issue
    1
  • fYear
    2010
  • Firstpage
    54
  • Lastpage
    66
  • Abstract
    This paper studies the power flow characterization of a bidirectional galvanically isolated high-power dual active bridge DC/DC converter. In experimental tests at the University of Michigan, we have observed three phenomena, which we term as internal power transfer, phase drift, and low system efficiency, that are present under certain operating conditions. These phenomena cannot be explained by conventional power transfer analysis. The authors develop a new model, based on a detailed analysis over a short time scale, that incorporates additional parameters, including the power semiconductor voltage loss and dead time. The new power flow model may be used to explain the observed phenomena and to characterize the power flow of the converter. The model may also be used to perform accurate power flow computations over a wide operating range, thereby supporting optimal hardware design, operating range selection, and power management strategy development. Experimental results are presented to illustrate the validity of the new model.
  • Keywords
    DC-DC power convertors; bridge circuits; load flow; bidirectional galvanically isolated high-power DC-DC converter; dead time; high-power dual active bridge DC-DC converter; internal power transfer; low system efficiency; operating range selection; phase drift; power flow characterization; power management strategy development; power semiconductor voltage loss; Bidirectional dc/dc converter; dual active bridge (DAB); phase shift modulation; power flow characterization;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2009.2024151
  • Filename
    5200460