DocumentCode :
1295879
Title :
Application of a high-precision Universal Measuring Machine in standards laboratory measurements
Author :
Braudaway, David W.
Author_Institution :
Sandia National Laboratories, Division 7241, Albuquerque, NM 87185
Issue :
4
fYear :
1987
Firstpage :
923
Lastpage :
927
Abstract :
A computer-controlled high-precision Universal Measuring Machine (UMM) of advanced design is being applied to the calibration of high-precision artifacts in one- and two-dimensional space, aided by checks against master length reference standards. These artifacts, principally step-gages and roundness standards, require ratio-type techniques similar to those employed in calibration of electrical ratio devices. The application is yielding significant time savings and accuracy enhancement. Analytical power of the machine´s computer system simplifies data collection, improves computation of results, and permits deterministic analysis where best judgment has been the practice.
Keywords :
Accuracy; Aerospace electronics; Calibration; Probes; Standards; Temperature measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312583
Filename :
6312583
Link To Document :
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