DocumentCode
1295879
Title
Application of a high-precision Universal Measuring Machine in standards laboratory measurements
Author
Braudaway, David W.
Author_Institution
Sandia National Laboratories, Division 7241, Albuquerque, NM 87185
Issue
4
fYear
1987
Firstpage
923
Lastpage
927
Abstract
A computer-controlled high-precision Universal Measuring Machine (UMM) of advanced design is being applied to the calibration of high-precision artifacts in one- and two-dimensional space, aided by checks against master length reference standards. These artifacts, principally step-gages and roundness standards, require ratio-type techniques similar to those employed in calibration of electrical ratio devices. The application is yielding significant time savings and accuracy enhancement. Analytical power of the machine´s computer system simplifies data collection, improves computation of results, and permits deterministic analysis where best judgment has been the practice.
Keywords
Accuracy; Aerospace electronics; Calibration; Probes; Standards; Temperature measurement; Voltage measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1987.6312583
Filename
6312583
Link To Document