• DocumentCode
    1295879
  • Title

    Application of a high-precision Universal Measuring Machine in standards laboratory measurements

  • Author

    Braudaway, David W.

  • Author_Institution
    Sandia National Laboratories, Division 7241, Albuquerque, NM 87185
  • Issue
    4
  • fYear
    1987
  • Firstpage
    923
  • Lastpage
    927
  • Abstract
    A computer-controlled high-precision Universal Measuring Machine (UMM) of advanced design is being applied to the calibration of high-precision artifacts in one- and two-dimensional space, aided by checks against master length reference standards. These artifacts, principally step-gages and roundness standards, require ratio-type techniques similar to those employed in calibration of electrical ratio devices. The application is yielding significant time savings and accuracy enhancement. Analytical power of the machine´s computer system simplifies data collection, improves computation of results, and permits deterministic analysis where best judgment has been the practice.
  • Keywords
    Accuracy; Aerospace electronics; Calibration; Probes; Standards; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312583
  • Filename
    6312583