• DocumentCode
    1295948
  • Title

    A Theoretical Analysis of the Role of Ambipolar Diffusion in Charge-Carrier Transport in a Quasi-Neutral Region Under High Injection

  • Author

    Edmonds, Larry D.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    58
  • Issue
    5
  • fYear
    2011
  • Firstpage
    2459
  • Lastpage
    2469
  • Abstract
    A recent theoretical analysis considered charge collection from an ionization source in a p-n junction silicon diode under steady-state conditions, i.e., carrier liberation is at a quasi-constant rate, and concluded that the quasi-neutral region partitions into distinct sub-regions. A later empirical investigation (via TCAD simulations) found that this partitioning also applies under transient conditions, but a theoretical explanation was not given for the transient problem. The theoretical analysis given here provides that explanation, and also explains why a charge-collection model derived under steady-state conditions gives correct predictions for the transient problem.
  • Keywords
    p-n junctions; particle beam injection; silicon radiation detectors; ambipolar diffusion; charge-carrier transport; charge-collection model; high injection; high-resistance region; ionization source; p-n junction silicon diode; quasineutral region; steady-state conditions; transient conditions; transient problem; Charge carrier density; Doping; Equations; Mathematical model; Predictive models; Steady-state; Transient analysis; Ambipolar diffusion; ambipolar region (AR); charge collection; drift-diffusion; high-resistance region (HRR); quasi-neutral region (QNR); regional partitioning;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2161884
  • Filename
    5982112