• DocumentCode
    1296068
  • Title

    Low Transparency Current Density and Low Internal Loss of 1060-nm InGaAs Laser With GaAsP–GaAs Superlattices as Strain-Compensated Layer

  • Author

    Wan, C.T. ; Su, Y.K. ; Yu, H.C. ; Huang, C.Y. ; Lin, W.H. ; Chen, W.C. ; Tseng, H.C. ; Horng, J.B. ; Hu, C. ; Tsau, Seth

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    21
  • Issue
    19
  • fYear
    2009
  • Firstpage
    1474
  • Lastpage
    1476
  • Abstract
    In this letter, the strained In0.22Ga0.78As-GaAs single quantum-well lasers grown by metal-organic vapor phase epitaxy were studied. The lasing wavelength of the fabricated InGaAs laser was 1056 nm, whereas the internal loss (alphai) and the transparency current density (Jtr) were 1.78 cm-1 and 40.2 A/cm2, respectively. By using the GaAsP-GaAs superlattices as strain-compensated layer, the lasing wavelength was 1052 nm, and the alphai and Jtr could be reduced to 0.63 cm-1 and 39.1 A/cm2, respectively. To the best of our knowledge, the Jtr was the lowest among the reported InGaAs lasers around 1060 nm.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; quantum well lasers; GaAsP-GaAs; InGaAs; low internal loss; low transparency current density; metal-organic vapor phase epitaxy; quantum-well lasers; strain-compensated layer; superlattices; wavelength 1052 nm; wavelength 1056 nm; wavelength 1060 nm; InGaAs; lasers, metal–organic vapor phase epitaxy (MOVPE);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2009.2028654
  • Filename
    5200510