The recording and processing of pulsed laser diode spectra

Author

Fuhr, Peter L. ; Maufer, Thomas A.

Author_Institution

Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA

Issue

1

fYear

1987

fDate

3/1/1987 12:00:00 AM

Firstpage

37

Lastpage

43

Abstract

A system capable of measuring and statistically analyzing wavelength and intensity fluctuations in pulsed-laser-diode output beams has been developed. The snapshot wavelength-intensity performance of laser diodes emitting discrete short-duration optical pulse is determined by isolating and recording individual pulses. Statistical processing of the resultant data generates information about the magnitude and/or frequency of occurrence of power variations of wavelength fluctuations in narrow optical bands. The system configuration, along with plots depicting results based on measurements taken for various laser diodes, are presented.

Keywords

fluctuations; semiconductor device testing; semiconductor junction lasers; spectral analysis; statistical analysis; discrete short-duration optical pulse; intensity fluctuations; power variations; pulsed laser diode spectra; semiconductor device testing; semiconductor junction laser; statistical analysis; wavelength; Arrays; Band pass filters; Diode lasers; Fluctuations; Optical filters; Optical pulses; Semiconductor lasers;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.1987.6312627

Filename

6312627