• DocumentCode
    1296359
  • Title

    Remeasurement of a Silicon lattice period

  • Author

    Deslattes, Richard D. ; Tanaka, Mitsuru ; Greene, Geoffrey L. ; Henins, Albert ; Kessler, Ernest G., Jr.

  • Author_Institution
    Quantum Metrology Group, National Bureau of Standards, Gaithersburg, MD 20899
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    166
  • Lastpage
    169
  • Abstract
    Opitcal interferometry of an Silicon lattice period is an important link between macroscopic and microscopic lengths as well as between low-energy and high-energy spectroscopies. An evident discrepancy between two pre-1982 measurements has limited the effective application of these results. Very recent results, reported here in a preliminary way, appear to further understanding and removing this discrepancy.
  • Keywords
    Atomic measurements; Crystals; Lattices; NIST; Optical diffraction; Optical interferometry; Silicon;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312661
  • Filename
    6312661
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1296359