Title :
Remeasurement of a Silicon lattice period
Author :
Deslattes, Richard D. ; Tanaka, Mitsuru ; Greene, Geoffrey L. ; Henins, Albert ; Kessler, Ernest G., Jr.
Author_Institution :
Quantum Metrology Group, National Bureau of Standards, Gaithersburg, MD 20899
fDate :
6/1/1987 12:00:00 AM
Abstract :
Opitcal interferometry of an Silicon lattice period is an important link between macroscopic and microscopic lengths as well as between low-energy and high-energy spectroscopies. An evident discrepancy between two pre-1982 measurements has limited the effective application of these results. Very recent results, reported here in a preliminary way, appear to further understanding and removing this discrepancy.
Keywords :
Atomic measurements; Crystals; Lattices; NIST; Optical diffraction; Optical interferometry; Silicon;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312661
