DocumentCode
1296417
Title
The relationship between the SI Ohm, the Ohm at NPL, and the quantized Hall resistance
Author
Hartland, Anthony ; Jones, R.Gareth ; Kibble, Bryan P. ; Legg, David J.
Author_Institution
Division of Electrical Science, National Physical Laboratory, Teddington, Middlesex, U.K.
Issue
2
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
208
Lastpage
213
Abstract
New measurements relating the quantized Hall resistance RH (= h/ie2), International System (SI) Ohm (ΩSI ), and the National Physical Laboratory maintained ohm (ΩNPL ) have now been completed at NPL in the U.K. with improvements and simplifications in the cryogenic current comparator measurements and 1000-Ω dc resistance measurements. From the measurements over the past four years the relationship between ΩNPL and ΩSI can be described by the equation ΩNPL − ΩSI = −1.049(0.020) − 0.0478(0.0074)[t − 1986.0] μΩ in which t is measured in years. For the previous two years the equivalent relationship between RH and ΩNPL is RH = 25 812.8(1 + 1.452(0.038) × 10 −6 + 0.0694(0.0772) · [t − 1986.0] × 10−6) ΩNPL in which the uncertainties (in parentheses) are one-standard-deviation (1σ) random uncertainties of the least squares fit to the data. Combining the most recent measurements of RH and ΩSI , using a more direct method of measurement RH = 25 812.8106(17) ΩSI in which the relative combined uncertainty is 0.067 × 10−6.
Keywords
Current measurement; Electrical resistance measurement; Measurement uncertainty; Resistance; Resistors; Temperature measurement; Uncertainty;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1987.6312670
Filename
6312670
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