DocumentCode :
1296417
Title :
The relationship between the SI Ohm, the Ohm at NPL, and the quantized Hall resistance
Author :
Hartland, Anthony ; Jones, R.Gareth ; Kibble, Bryan P. ; Legg, David J.
Author_Institution :
Division of Electrical Science, National Physical Laboratory, Teddington, Middlesex, U.K.
Issue :
2
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
208
Lastpage :
213
Abstract :
New measurements relating the quantized Hall resistance RH(= h/ie2), International System (SI) Ohm (ΩSI), and the National Physical Laboratory maintained ohm (ΩNPL) have now been completed at NPL in the U.K. with improvements and simplifications in the cryogenic current comparator measurements and 1000-Ω dc resistance measurements. From the measurements over the past four years the relationship between ΩNPL and ΩSI can be described by the equation ΩNPL − ΩSI = −1.049(0.020) − 0.0478(0.0074)[t − 1986.0] μΩ in which t is measured in years. For the previous two years the equivalent relationship between RH and ΩNPL is RH = 25 812.8(1 + 1.452(0.038) × 10 −6 + 0.0694(0.0772) · [t − 1986.0] × 10−6) ΩNPL in which the uncertainties (in parentheses) are one-standard-deviation (1σ) random uncertainties of the least squares fit to the data. Combining the most recent measurements of RH and ΩSI, using a more direct method of measurement RH = 25 812.8106(17) ΩSI in which the relative combined uncertainty is 0.067 × 10−6.
Keywords :
Current measurement; Electrical resistance measurement; Measurement uncertainty; Resistance; Resistors; Temperature measurement; Uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312670
Filename :
6312670
Link To Document :
بازگشت