• DocumentCode
    1296417
  • Title

    The relationship between the SI Ohm, the Ohm at NPL, and the quantized Hall resistance

  • Author

    Hartland, Anthony ; Jones, R.Gareth ; Kibble, Bryan P. ; Legg, David J.

  • Author_Institution
    Division of Electrical Science, National Physical Laboratory, Teddington, Middlesex, U.K.
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    208
  • Lastpage
    213
  • Abstract
    New measurements relating the quantized Hall resistance RH(= h/ie2), International System (SI) Ohm (ΩSI), and the National Physical Laboratory maintained ohm (ΩNPL) have now been completed at NPL in the U.K. with improvements and simplifications in the cryogenic current comparator measurements and 1000-Ω dc resistance measurements. From the measurements over the past four years the relationship between ΩNPL and ΩSI can be described by the equation ΩNPL − ΩSI = −1.049(0.020) − 0.0478(0.0074)[t − 1986.0] μΩ in which t is measured in years. For the previous two years the equivalent relationship between RH and ΩNPL is RH = 25 812.8(1 + 1.452(0.038) × 10 −6 + 0.0694(0.0772) · [t − 1986.0] × 10−6) ΩNPL in which the uncertainties (in parentheses) are one-standard-deviation (1σ) random uncertainties of the least squares fit to the data. Combining the most recent measurements of RH and ΩSI, using a more direct method of measurement RH = 25 812.8106(17) ΩSI in which the relative combined uncertainty is 0.067 × 10−6.
  • Keywords
    Current measurement; Electrical resistance measurement; Measurement uncertainty; Resistance; Resistors; Temperature measurement; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312670
  • Filename
    6312670