مرکز منطقه ای اطلاع رساني علوم و فناوري - Determination of the quantized hall resistance value by using a calculable capacitor at ETL

DocumentCode :

1296423

Title :

Determination of the quantized hall resistance value by using a calculable capacitor at ETL

Author :

Shida, Katsunori ; Wada, Toshimi ; Nishinaka, Hidefumi ; Kobayashi, Minoru ; Yonezaki, Genta ; Igarashi, Takashi ; Nemoto, Toshio

Author_Institution :

Electrotechnical Laboratory, 1-1-4, Umezono, Sakuramura, Niihari-gun. Ibaraki, 305 Japan

Issue :

fYear :

1987

fDate :

6/1/1987 12:00:00 AM

Firstpage :

214

Lastpage :

217

Abstract :

We report the International System (SI) value of the quantized Hall resistance (RH) determined by using a calculable capacitor at the electrotechnical laboratory (ETL). As the result of our measurements at ETL, a most reliable value of h / e² has been estimated as 25 812.8036 ΩSI with a systematic uncertainty of 0.25 ppm root sum square (rss) and a random error of 0.20 ppm one standard deviation (1σ).

Keywords :

Capacitors; Electrical resistance measurement; Resistance; Resistors; Silicon; Temperature measurement; Uncertainty;

fLanguage :

English

Journal_Title :

Instrumentation and Measurement, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9456

Type :

jour

DOI :

10.1109/TIM.1987.6312671

Filename :

6312671

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1296423