DocumentCode
1296428
Title
Quantum Hall measurements from 4 K to 20 mK
Author
Wood, Barry M. ; D´Iorio, M.
Author_Institution
Division of Physics, National Research Council of Canada, Ottawa, Ont., Canada K 1 A 0R6
Issue
2
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
218
Lastpage
221
Abstract
We report on precision measurements of the quantum Hall resistance (QHR) in the temperature range of 20 mK to 4 K. These include intercomparisons of the ohm maintained at the National Research Council (OHM NRC) and the International System ohm (OHM SI) and the QHR. The effects of nonzero Rxx minima, sample inhomogeneity, nonohmic contacts, and dissipation are summarized.
Keywords
Current measurement; Electrical resistance measurement; Magnetic field measurement; Resistance; Silicon; Temperature measurement; Voltage measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1987.6312672
Filename
6312672
Link To Document