Title :
Monitoring the U.S. legal unit of resistance via the quantum Hall effect
Author :
Cage, Marvin E. ; Dziuba, Ronald F. ; Field, Bruce F. ; Kiess, Thomas E. ; Van Degrift, Craig T.
Author_Institution :
Electricity Division, National Bureau of Standards, Gaithersburg, MD 20899
fDate :
6/1/1987 12:00:00 AM
Abstract :
The quantum Hall effect is being used to monitor the resistances of the five 1-Ω Thomas-type resistors which define the U.S. legal unit of resistance, the ohm maintained at the National Bureau of Standards (ΩNBS). Typically, the total one-standard-deviation (1σ) accuracy for the transfer between three different GaAs quantum Hall devices and the five 1-Ω resistors is ±0.05 ppm. Measurements to date provide the first direct evidence that the value of ΩNBS is decreasing by about (0.05 ± 0.02) ppm per year.
Keywords :
Electrical resistance measurement; Measurement uncertainty; NIST; Resistance; Resistors; Temperature measurement; Uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312673