• DocumentCode
    1296433
  • Title

    Monitoring the U.S. legal unit of resistance via the quantum Hall effect

  • Author

    Cage, Marvin E. ; Dziuba, Ronald F. ; Field, Bruce F. ; Kiess, Thomas E. ; Van Degrift, Craig T.

  • Author_Institution
    Electricity Division, National Bureau of Standards, Gaithersburg, MD 20899
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    222
  • Lastpage
    225
  • Abstract
    The quantum Hall effect is being used to monitor the resistances of the five 1-Ω Thomas-type resistors which define the U.S. legal unit of resistance, the ohm maintained at the National Bureau of Standards (ΩNBS). Typically, the total one-standard-deviation (1σ) accuracy for the transfer between three different GaAs quantum Hall devices and the five 1-Ω resistors is ±0.05 ppm. Measurements to date provide the first direct evidence that the value of ΩNBS is decreasing by about (0.05 ± 0.02) ppm per year.
  • Keywords
    Electrical resistance measurement; Measurement uncertainty; NIST; Resistance; Resistors; Temperature measurement; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312673
  • Filename
    6312673