DocumentCode :
1296455
Title :
The quantum Hall effect as a standard to define the laboratory unit of resistance
Author :
Schwitz, Wolfgang ; Bauder, Lucien ; Bühlmann, Hans-jörg ; Py, Marcel A. ; Ilegems, Marc
Author_Institution :
Swiss Federal Office of Metrology, CH-3084 Wabern/Bern, Switzerland
Issue :
2
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
240
Lastpage :
244
Abstract :
A measurement system has been developed to determine the resistance of integer quantum Hall plateaux relative to a room-temperature reference resistor network of nominally the same values. Silicon MOSFET and GaAs-AlGaAs samples have been successfully fabricated and measured. The results confirm that the integer quantum Hall effect (QHE) may be used to monitor a group of standard resistors comprising the laboratory unit of resistance. They demonstrate the feasibility of defining the laboratory unit of resistance by adopting a value for the quantum Hall resistance h/e2.
Keywords :
Hall effect; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312677
Filename :
6312677
Link To Document :
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