Title :
The quantum Hall effect as a standard to define the laboratory unit of resistance
Author :
Schwitz, Wolfgang ; Bauder, Lucien ; Bühlmann, Hans-jörg ; Py, Marcel A. ; Ilegems, Marc
Author_Institution :
Swiss Federal Office of Metrology, CH-3084 Wabern/Bern, Switzerland
fDate :
6/1/1987 12:00:00 AM
Abstract :
A measurement system has been developed to determine the resistance of integer quantum Hall plateaux relative to a room-temperature reference resistor network of nominally the same values. Silicon MOSFET and GaAs-AlGaAs samples have been successfully fabricated and measured. The results confirm that the integer quantum Hall effect (QHE) may be used to monitor a group of standard resistors comprising the laboratory unit of resistance. They demonstrate the feasibility of defining the laboratory unit of resistance by adopting a value for the quantum Hall resistance h/e2.
Keywords :
Hall effect; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312677