DocumentCode :
1296462
Title :
Quantized Hall resistance measurement at the NML
Author :
Ricketts, Brian W. ; Cage, Marvin E.
Author_Institution :
Commonwealth Scientific and Industrial Research Organization, Division of Applied Physics, National Measurement Laboratory, Sydney, Australia 2070
Issue :
2
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
245
Lastpage :
248
Abstract :
An automatic measurement system has been used to determine the values of quantized Hall resistances RH in terms of the National Measurement Laboratory (NML) realization of the International System (SI) ohm. The quantized Hall resistances of two GaAs-AlGaAs heterostructures were measured. The n = 2 step of one heterostructure and the n = 4 step of the other were measured over a seven-month period. A weighted mean of these determinations gave a value for the quantity RH(n = 1) of 0.383 ppm (0.078 ppm one-standard-deviation (1σ) uncertainty) above the nominal 25 812.80 Ω in SI units.
Keywords :
Current measurement; Electrical resistance measurement; Resistance; Resistors; Silicon; Temperature measurement; Uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312678
Filename :
6312678
Link To Document :
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