Title :
Monolithically integrated laser/photodetector
Author :
Dutta, N.K. ; Cella, Tommaso ; Zilko, J.L. ; Piccirilli, A.B. ; Brown, Robert L.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ
fDate :
3/17/1988 12:00:00 AM
Abstract :
The fabrication and performance characteristics of a laser structure with monolithically integrated monitoring photodiode are described. The structure utilises semi-insulating Fe doped InP layers for confinement of the current to the active region of the laser and for the separation of the laser and the photodetector sections. The lasers have threshold currents in the range 3-40 mA and emit in a single frequency by virtue of frequency selective feedback, provided by a grating etched on the substrate. The photodetector provides ≃300 μA of photocurrent per mW of laser power which is comparable to the value for a large area Ge photodiode generally used to monitor laser power. The new structure also minimises the unwanted reflection effects on laser performance caused by light reflected from the photodiode interface
Keywords :
III-V semiconductors; diffraction gratings; feedback; gallium arsenide; gallium compounds; indium compounds; integrated optics; integrated optoelectronics; iron; laser frequency stability; optical waveguides; photodetectors; semiconductor junction lasers; vapour phase epitaxial growth; 30 to 40 mA; III-V semiconductors; InP:Fe-GaInAsP; MOCVD; etched grating; fabrication; frequency selective feedback; integrated laser/photodetector; integrated optoelectronics; performance characteristics; photodiode monitor; semiconductor lasers; semiinsulating layers;
Journal_Title :
Electronics Letters