Title :
Automated measurement of current dependency of contact resistance in low current level switches
Author :
Ikeda, Hiroaki ; Ishida, Kimitaka ; Shirako, Kiyoshi
Author_Institution :
Department of Electronic Engineering, Chiba University, 1-33 Yayoi-cho, Chiba 260, Japan
fDate :
6/1/1987 12:00:00 AM
Abstract :
The very low contact resistance of a mechanical switch is measured under a very low current level. The results are used to reveal the current dependency of the metal-to-metal contacts. The variation of the resistance indicates the characteristics of mechanical switches used especially in circuits having very low level signals. An automated measurement system is designed and used for testing purposes in a factory.
Keywords :
Contact resistance; Current measurement; Electrical resistance measurement; Noise; Noise measurement; Resistance; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1987.6312707