DocumentCode :
1296644
Title :
Automated measurement of current dependency of contact resistance in low current level switches
Author :
Ikeda, Hiroaki ; Ishida, Kimitaka ; Shirako, Kiyoshi
Author_Institution :
Department of Electronic Engineering, Chiba University, 1-33 Yayoi-cho, Chiba 260, Japan
Issue :
2
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
390
Lastpage :
393
Abstract :
The very low contact resistance of a mechanical switch is measured under a very low current level. The results are used to reveal the current dependency of the metal-to-metal contacts. The variation of the resistance indicates the characteristics of mechanical switches used especially in circuits having very low level signals. An automated measurement system is designed and used for testing purposes in a factory.
Keywords :
Contact resistance; Current measurement; Electrical resistance measurement; Noise; Noise measurement; Resistance; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1987.6312707
Filename :
6312707
Link To Document :
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