Title :
Unsharp Masking Sharpening Detection via Overshoot Artifacts Analysis
Author :
Cao, Gang ; Zhao, Yao ; Ni, Rongrong ; Kot, Alex C.
Author_Institution :
Inst. of Inf. Sci., Beijing Jiaotong Univ., Beijing, China
Abstract :
In this letter, we propose a new method in detecting unsharp masking (USM) sharpening operation in digital images. Overshoot artifacts are found to occur around side-planar edges in the sharpened images. Such artifacts, measured by a sharpening detector, can serve as a rather unique feature for identifying the previous performance of sharpening operation. Test results on photograph images with regard to various sharpening operators show the effectiveness of our proposed method.
Keywords :
image enhancement; image restoration; security of data; USM sharpening operation; digital images; image forgery; image sharpening; overshoot artifacts analysis; sharpening detector; side-planar edges; unsharp masking sharpening detection; Detection algorithms; Digital images; Feature extraction; Forgery; History; Image edge detection; Optical filters; Digital forensics; image sharpening; overshoot artifacts; unsharp masking;
Journal_Title :
Signal Processing Letters, IEEE
DOI :
10.1109/LSP.2011.2164791
