• DocumentCode
    1296993
  • Title

    Should the classical variance be used as a basic measure in standards metrology?

  • Author

    Allan, David W.

  • Author_Institution
    National Bureau of Standards, Time and Frequency Division, Boulder, CO 80303
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    646
  • Lastpage
    654
  • Abstract
    Since a measurement is no better than its uncertainty, specifying the uncertainty is a very important part of metrology. One is inclined to believe that the fundamental constants in physics are invariant with time and that they are the foundation upon which to build internationl system (SI) standards and metrology. Therefore clearly specifying uncertainties for these physical invariants at state-of-the-art levels should be one of the principal goals of metrology. However, by the very act of observing some physical quantity we may perturb the standard, thus introducing uncertainties. The random deviations in a series of observations may be caused by the measurement system, by environmental coupling or by intrinsic deviations in the standard. For these reasons and because correlated random noise is as commonly occurring in nature as uncorrelated random noise, the universal use of the classical variance, and the standard deviation of the mean may cloud rather than clarify questions regarding uncertainties; i.e., these measures are well behaved only for random uncorrelated deviations (white noise), and white noise is typically a subset of the spectrum of observed deviations. The assumption that each measurement in a series is independent because the measurements are taken at different times should be called into question if, in fact, the series is not random and uncorrelated, i.e., does not have a white spectrum. In this paper, studies of frequency standards, standard-volt cells, and gauge blocks provide examples of long-term random-correlated time series which indicate behavior that is not “white” (not random and uncorrelated). This paper outlines and illustrates a straightforward time-domain statistical approach, which for power-law spectra yields an alternative estimation method for most of the important random power-law processes encountered. Knowing the spectrum provides for clearer uncertainty assessment in the presence of correlated random deviat- ons, the statistical approach outlined also provides a simple test for a white spectrum, thus allowing a metrologist to know whether use of the classical variance is suitable or whether to incorporate better uncertainty assessment procedures, e.g., as outlined in the paper.
  • Keywords
    Metrology; Standards; Time frequency analysis; Time measurement; Time series analysis; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1987.6312761
  • Filename
    6312761