• DocumentCode
    1297087
  • Title

    Correction of Order Parameter Calculations for FePt Perpendicular Thin Films

  • Author

    Yang, En ; Laughlin, David E. ; Zhu, Jian-Gang

  • Author_Institution
    Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    48
  • Issue
    1
  • fYear
    2012
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    The order parameter of FePt thin films plays an essential role in determining such diverse materials properties as magneto-crystalline anisotropy, magnetic coercivity and magnetic recording density. Typically, the order parameter for a bulk material is obtained by measuring the X-ray integrated intensity ratio of a super lattice peak to a fundamental peak and comparing this ratio to a theoretical value which has been calculated for a fully ordered sample. In this work, we present an analysis of the order parameter calculation in FePt L10 thin films taking into account the geometric features of the X-ray diffractometer, the crystallographic texture of FePt films, and the finite thickness of the films. The theoretical ratio of the (001) super lattice peak of FePt and the (002) fundamental peak of FePt is calculated as a function of the full width half maximum (FWHM) diffraction peaks from film and thickness for FePt thin films with perpendicular texture. A reliable order parameter calculation equation for Fe50Pt50 fiber textured perpendicular recording media is established.
  • Keywords
    X-ray diffraction; coercive force; iron alloys; magnetic thin film devices; magnetic thin films; metallic thin films; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; texture; (001) superlattice peak; (002) fundamental peak; FePt; FePt perpendicular thin films; X-ray diffractometer; X-ray integrated intensity ratio; XRD; bulk material; crystallographic texture; diverse material properties; fiber textured perpendicular recording media; finite thickness; full width half maximum diffraction peaks; magnetic coercivity; magnetic recording density; magnetocrystalline anisotropy; order parameter calculation equation; perpendicular texture; Absorption; Detectors; Diffraction; Films; Magnetic recording; Optical fiber polarization; X-ray diffraction; FePt; Lorentz factor; fiber texture; order parameter;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2164547
  • Filename
    5983445