Evaluating the Impact of DfM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core

Author

Rech, Paolo ; Paccagnella, Alessandro ; Grosso, Michelangelo ; Reorda, Matteo Sonza ; Melchiori, Fabio ; Loparco, Domenico ; Appello, Davide

Author_Institution

Dipt. di Ing. Elettron. e Inf., Univ. di Padova, Padova, Italy

Volume

57

Issue

4

fYear

2010

Firstpage

2098

Lastpage

2105

Abstract

This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented using three different standard cell libraries. Each library is based on a different Design for Manufacturability (DfM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested resorting to advanced Design for Testability (DfT) methodologies and radiation experiments results are compared. Electrical simulations of flip-flops are finally performed to propose physical motivations to the observed phenomena.

Keywords

alpha-particle effects; design for manufacture; design for testability; flip-flops; microprocessor chips; radiation hardening (electronics); DfM library optimizations; advanced Design for Testability; alpha single event upset test; alpha-induced SEU sensitivity; alpha-induced Soft Errors; design for manufacturability optimization strategy; flip flops electrical simulations; microprocessor core; radiation experiments; Circuit faults; Design for manufacture; Design for testability; Design optimization; Electronic packaging thermal management; Layout; Libraries; Manufacturing; Microprocessors; Optimization; Robustness; Sensitivity; Single event upset; System-on-a-chip; Testing; Alpha particles; Design for Manufacturability (DfM); microprocessor; radiation effect; standard cells;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2049119

Filename

5550318