• DocumentCode
    1297245
  • Title

    The Radiation Hardness Assurance Facility at INFN-LNS Catania for the Irradiation of Electronic Components in Air

  • Author

    Menichelli, Mauro ; Alpat, Behcet ; Papi, Andrea ; Sorensen, Reno Harboe ; Cirrone, Giuseppe Antonio Pablo ; Ferrera, Francesco ; Figuera, Pierpaolo ; Finocchiaro, Paolo ; Lattuada, Marcello ; Rifuggiato, Danilo ; Bizzarri, Fabrizio ; Caraffini, Diego ; P

  • Author_Institution
    Ist. Naz. di Fis. Nucleare, Sezione di Perugia, Perugia, Italy
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    2074
  • Lastpage
    2078
  • Abstract
    This paper describes the beam flux monitoring system that has been developed at the Superconducting Cyclotron at INFN-LNS (Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud, Catania, Italy) in order to monitor the beam parameters such as energy, flux, beam profile, for SEE (Single Event Effects) cross-sections determination and DD (Displacement Damage) studies. In order to have an accurate and continuous monitoring of beam parameters we have developed fully automatic dosimetry setup to be used during SEE (with heavy ions) and DD (with protons up to 60 MeV) tests of electronic devices and systems. The final goal of our activity is to demonstrate that the operation of such a system in air is not detrimental to the accuracy on controlling the beam profile, energy and fluence delivered onto the DUT (Device Under Test) surface, even with non relativistic heavy ions. We have tested our beam monitoring system with the “Reference SEU monitor” developed by ESA/ESTEC, the results are discussed here.
  • Keywords
    cyclotrons; dosimetry; ion accelerators; particle beam diagnostics; proton effects; DUT surface; INFN-LNS Catania; LNS superconducting cyclotron; automatic dosimetry setup; beam flux monitoring system; beam parameter monitoring; electronic component irradiation; electronic devices; nonrelativistic heavy ions; radiation hardness assurance facility; reference SEU monitor; single event effects; Calibration; Computerized monitoring; Condition monitoring; Cyclotrons; Detectors; Dosimetry; Electronic components; Electronic equipment testing; Ions; Laboratories; Laser beams; Measurement by laser beam; Monitoring; Particle beams; Protons; Silicon; System testing; Dosimetry; heavy ion accelerators; radiation effects; radiation tests;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2049582
  • Filename
    5550324