Title :
Concurrent test method for OTA-C filters
Author :
Lee, Kuen-Jong ; Huang, Kou-Shung ; Wang, Wei-Chung
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
1/2/1997 12:00:00 AM
Abstract :
A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the function of circuit components can be concurrently detected
Keywords :
active filters; circuit testing; concurrent engineering; design for testability; operational amplifiers; OTA-C filter; circuit under test; concurrent testing; testable design;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970045
