DocumentCode
129733
Title
A calculation and validation of electrical resistance of quartz crystal resonators with structural viscosity
Author
Hui Chen ; Ji Wang ; Tingfeng Ma ; Jianke Du ; Julian Shen ; Shi-Yung Pao ; Min-Chiang Chao
Author_Institution
Sch. of Mech. Eng. & Mech., Ningbo Univ., Ningbo, China
fYear
2014
fDate
3-6 Sept. 2014
Firstpage
1979
Lastpage
1982
Abstract
We study the calculation of electrical resistance of AT-cut quartz crystal resonators with the consideration of structural viscosity. A theoretical analysis of electrically forced vibrations of the coupled fundamental thickness-shear and spurious modes of a rectangular resonator model which is a partially electroded quartz crystal plate with free edges is performed. The equations are derived for calculating the electrical parameters, which can be used for the characterization of electronic devices, are obtained from the first-order Mindlin plate theory with the consideration of equivalent viscous dissipation of piezoelectric plates. Numerical results of the electrical resistance of resonators are obtained. It is found that through adding proper equivalent viscosity coefficient in electroded portion of the crystal plate, the calculated results of resistance is in good agreement with measurements from actual product samples.
Keywords
crystal resonators; electric resistance; piezoelectric materials; plates (structures); vibrations; viscosity; AT-cut quartz crystal resonators; coupled fundamental thickness-shear; electrical parameters; electrical resistance; electrically forced vibrations; electroded portion; electroded quartz crystal plate; electronic devices; equivalent viscosity coefficient; first-order Mindlin plate theory; free edges; piezoelectric plates; rectangular resonator model; spurious modes; structural viscosity; theoretical analysis; Crystals; Electrodes; Equations; Mathematical model; Vibrations; Viscosity; crystal; quartz; resistance; resonator; viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2014 IEEE International
Conference_Location
Chicago, IL
Type
conf
DOI
10.1109/ULTSYM.2014.0492
Filename
6932191
Link To Document