DocumentCode :
1297438
Title :
Carrier dynamics studies through free-carrier absorption: a Monte Carlo study for silicon
Author :
Jiang, Hongtao ; Hinckley, John M. ; Singh, Jasprit
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
33
Issue :
10
fYear :
1997
fDate :
10/1/1997 12:00:00 AM
Firstpage :
1779
Lastpage :
1783
Abstract :
Monte Carlo based computer simulations normally used for transport studies in semiconductors are extended and used to study free-carrier absorption of subbandgap radiation in semiconductors. The approach is applied to n-type silicon where we find very good agreement with experimental results and calculations based on quantum electrodynamics. The computer simulation method also allows us to study free-carrier absorption in semiconductors with a dc bias. We solve the classical transport equation to show that the absorption coefficient in the presence of a dc bias can be used to obtain information on the carrier temperature, momentum relaxation time, as well as energy relaxation time. Monte Carlo studies show this to be the case. Thus, we show that important carrier dynamics properties can be obtained from long-wavelength free-carrier absorption studies done on samples with a dc bias
Keywords :
Monte Carlo methods; absorption coefficients; carrier relaxation time; electroabsorption; elemental semiconductors; high field effects; hot carriers; silicon; Monte Carlo based computer simulations; Si; absorption coefficient; carrier dynamics; carrier temperature; classical transport equation; dc bias; energy relaxation time; free-carrier absorption; high field transport; momentum relaxation time; n-type Si; quantum electrodynamics; semiconductors; subbandgap radiation; Computer simulation; Electromagnetic wave absorption; Energy measurement; Monte Carlo methods; Optical scattering; Particle scattering; Probes; Silicon; Temperature; Velocity measurement;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.631283
Filename :
631283
Link To Document :
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