Title :
Development of a New Methodology to Model the Synergistic Effects Between TID and ASETs
Author :
Roche, Nicolas J H ; Dusseau, L. ; Boch, J. ; Velo, Y. Gonzalez ; Vaillé, J.R. ; Saigne, F. ; Auriel, G. ; Azais, B. ; Buchner, S.P. ; Marec, R. ; Calvel, P. ; Bezerra, F.
Author_Institution :
IES, Univ. Montpellier II, Montpellier, France
Abstract :
A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.
Keywords :
high level synthesis; network analysis; operational amplifiers; radiation effects; ASET; TID; analog single event transients propagation; circuit analysis; high level model; operational amplifier; synergistic effects; total ionizing dose; Analog integrated circuits; Analytical models; Bipolar integrated circuits; Circuit analysis; Circuit simulation; Degradation; Feedback; Gain; Integrated circuit modeling; Operational amplifiers; Predictive models; Shape; Transistors; Voltage measurement; Bipolar analog integrated circuits; integrated circuit modeling; ionizing dose; single event transient; transient propagation; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2042616
