Title :
Very high-frequency small-signal equivalent circuit for short gate-length InP HEMTs
Author :
Miras, Agnès ; Legros, Eric
Author_Institution :
Lab. de Bagneux, CNET, Bagneux, France
fDate :
7/1/1997 12:00:00 AM
Abstract :
A small-signal equivalent circuit for short gate-length InP high electron-mobility transistors (HEMTs) operating at very high frequency (HF) is proposed. First, the extrinsic parameters of the equivalent circuit are determined using a cold HEMT, but without forward gate bias. Then the intrinsic parameters of the equivalent circuit are extracted, including the frequency dependence of some of them. A fast and accurate method based on least-squares regressions is presented to obtain the extrinsic and intrinsic parameters from measured S-parameters. The improved equivalent circuit accurately fits the S-parameters of 0.25-μm InP HEMTs over the 500-MHz up to 40-GHz measurement bandwidth, for all gate-to-source and drain-to-source voltages
Keywords :
III-V semiconductors; S-parameters; UHF field effect transistors; equivalent circuits; high electron mobility transistors; indium compounds; least squares approximations; semiconductor device models; 0.25 micron; 500 MHz to 40 GHz; InP; S-parameters; least-squares regression; short gate-length InP HEMT; very high-frequency small-signal equivalent circuit; Current measurement; Equivalent circuits; Frequency dependence; HEMTs; Indium phosphide; MODFETs; Microwave measurements; Performance evaluation; VHF circuits; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on